期刊
OPTICS AND LASERS IN ENGINEERING
卷 105, 期 -, 页码 173-181出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.optlaseng.2018.01.018
关键词
Phase shift; Phase retrieval; Three-dimensional measurement; Fringe analysis; Invalid-point removal
类别
资金
- National Natural Science Foundation of China (NSFC) [61377104]
In structured-light measurement, there unavoidably exist many invalid points caused by shadows, image noise and ambient light. According to the property of the epipolar constraint, because the retrieved phase of the invalid point is inaccurate, the corresponding projector image coordinate (PIC) will not satisfy the epipolar constraint. Based on this fact, a new invalid-point removal method based on the epipolar constraint is proposed in this paper. First, the fundamental matrix of the measurement system is calculated, which will be used for calculating the epipolar line. Then, according to the retrieved phase map of the captured fringes, the PICs of each pixel are retrieved. Subsequently, the epipolar line in the projector image plane of each pixel is obtained using the fundamental matrix. The distance between the corresponding PIC and the epipolar line of a pixel is defined as the invalidation criterion, which quantifies the satisfaction degree of the epipolar constraint. Finally, all pixels with a distance larger than a certain threshold are removed as invalid points. Experiments verified that the method is easy to implement and demonstrates better performance than state-of-the-art measurement systems. (C) 2018 Elsevier Ltd. All rights reserved.
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