期刊
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IOP PUBLISHING LTD
DOI: 10.1088/1742-6596/430/1/012124
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Quick scanning X-ray absorption spectroscopy was combined with the grazing incidence geometry for the time resolved in situ investigation of surfaces and thin films. The results demonstrate that a time resolution of about 50 ms for a single spectrum is feasible using a dedicated monochromator. In-situ investigations performed during the sputter deposition of thin gold films demonstrate the capabilities of this new approach.
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