期刊
NANOSCALE RESEARCH LETTERS
卷 13, 期 -, 页码 -出版社
SPRINGER
DOI: 10.1186/s11671-018-2563-9
关键词
Aluminum-doped zinc oxide; Infrared; Spectroscopic ellipsometry; Absorber
资金
- National Natural Science Foundation of China [11674062, 61376016, 61427815]
- National Science and Technology Major Project of China [2011ZX02109-004]
- Ministry of Science and Technology of the People's Republic of China [2016YFE0110700]
- Science and Technology Commission of Shanghai Municipality Project of China [12XD1420600]
The optical properties of aluminum-doped zinc oxide (AZO) thin films were calculated rapidly and accurately by point-by-point analysis from spectroscopic ellipsometry (SE) data. It was demonstrated that there were two different physical mechanisms, i.e., the interfacial effect and crystallinity, for the thickness-dependent permittivity in the visible and infrared regions. In addition, there was a blue shift for the effective plasma frequency of AZO when the thickness increased, and the effective plasma frequency did not exist for AZO ultrathin films (< 25 nm) in the infrared region, which demonstrated that AZO ultrathin films could not be used as a negative index metamaterial. Based on detailed permittivity research, we designed a near-perfect absorber at 2-5 pm by etching AZO-ZnO alternative layers. The alternative layers matched the phase of reflected light, and the void cylinder arrays extended the high absorption range. Moreover, the AZO absorber demonstrated feasibility and applicability on different substrates.
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