4.8 Article

Limits of Directed Self-Assembly in Block Copolymers

期刊

NANO LETTERS
卷 18, 期 6, 页码 3766-3772

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.8b00997

关键词

directed self-assembly; block copolymers; defects; self-consistent field theory

资金

  1. U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Science and Engineering [ER46919]
  2. NSF [CMMI1246740]
  3. TSMC
  4. NSF MRSEC at MIT [NSF1419807]

向作者/读者索取更多资源

Understanding the conditions under which defects appear in self-assembling soft-matter systems is of great importance, for example, in the development of block-copolymer (BCP) nanolithography. Here, we explore the limits of the directed self-assembly of BCPs by deliberately adding random imperfections to the template. Our results show that defects emerge due to local shear-like distortions of the polymer-template system, a new mechanism that is fundamentally different from the canonical mechanisms of 2D melting. Furthermore, our results provide a general criterion for melting, obtaining the highest tolerance to random deviations from the perfect template at about 0.1L(0), where L-0 is the natural BCP periodicity. These findings establish the limits of directed self-assembly of BCPs and can be extended to other classes of materials with soft interactions.

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