3.8 Proceedings Paper

Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

出版社

SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.2025377

关键词

X-ray free electron laser; Focusing mirror; Ablation; Damage threshold; Hard X-ray

资金

  1. Ministry of Education, Sports, Culture, Science and Technology, Japan (MEXT) [23226004]
  2. Grants-in-Aid for Scientific Research [13J00129, 23226004] Funding Source: KAKEN

向作者/读者索取更多资源

X-ray free electron lasers (XFELs) with intense and ultra-short pulse X-rays possibly induce damage to optical elements. We investigated the damage thresholds of optical materials by using focusing XFEL beams with sufficient power density for studying ablation phenomena. 1-mu m focusing beams with 10 keV photon energy were produced at the XFEL facility SACLA (SPring-8 Angstrom Compact free electron LAser). The focusing beams irradiated samples of rhodium-coated substrate, which is used in X-ray mirror optics, under grazing incident condition.

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