期刊
MATERIALS LETTERS
卷 225, 期 -, 页码 82-84出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2018.04.109
关键词
Cu2ZnSnSe4; Disorder; Secondary phases; Raman; X-ray techniques
资金
- National Natural Science Foundation of China [61525503, 61620106016, 81727804, 61722508]
- National Basic Research Program of China [2015CB352005]
- Guangdong Natural Science Foundation Innovation Team [2014A030312008]
- Shenzhen Basic Research Project [JCYJ20150930104948169, JCYJ20160328144746940, GJHZ20160226202139185, JCYJ20170412105003520]
- National Academy of Science of Ukraine [8/18-H]
The influence of thickness on the structural parameters, off-stoichiometry and cation disorder in kesterite Cu2ZnSnSe4 films grown by flash deposition for solar cell absorbers is investigated employing X-ray diffraction, energy-dispersive X-ray and Raman spectroscopies. It is shown that the lattice parameters of Cu2ZnSnSe4 changed depending on film thickness: the 100 nm film turned out to be weakly stretched on the molybdenum-coated glass substrates, while, in the thicker films, the compressive deformation is defined. The causes of the changes in film structure are outlined. Raman spectra revealed secondary phases like Cu2SnSe3 detecting reduction of its fraction with an increment in thickness; also, the Sn-Zn antisite defect fraction decreases. Simultaneously, the share of disordered kesterite phase associated with CuZn antisite defects rises with thickness. The obtained results can be useful for optimization of technological growth process. (C) 2018 Elsevier B.V. All rights reserved.
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