期刊
JOURNAL OF PHYSICS-CONDENSED MATTER
卷 30, 期 31, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1361-648X/aacf61
关键词
field emission; hot electrons; penetration length; ZnO nanowire
资金
- National Key Research and Development Program of China [2016YFA0202001]
- National Natural Science Foundation of China [61701551]
- Fundamental Research Funds for the Central Universities
- Research Funds of Guangzhou Science Technology and Innovation Commission [201504010012]
ZnO nanowires as field emitters have important applications in flat panel display and x-ray source. Understanding the intrinsic field emission mechanism is crucial for further improving the performance of ZnO nanowire field emitters. In this article, the temperature dependent field emission from individual ZnO nanowires was investigated by an in situ measurement in ultra-high vacuum. The divergent temperature-dependent Fowler-Nordheim plots is found in the low field region. A field-induced hot electrons emission model, that takes into account penetration length, is proposed to explain the results. The carrier density and temperature dependence of the field-induced hot electrons emission current are derived theoretically. The obtained results are consistent with the experimental results, which could be attributed to the variation of effective electron temperature. All of these are important for a better understanding on the field emission process of semiconductor nanostructures.
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