4.8 Article

Slow Auger Relaxation in HgTe Colloidal Quantum Dots

期刊

JOURNAL OF PHYSICAL CHEMISTRY LETTERS
卷 9, 期 9, 页码 2208-2211

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.jpclett.8b00750

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资金

  1. Defense Advanced Research Projects Agency (DARPA)
  2. NSF [DMR-1708378]
  3. University of Chicago Materials Research Science and Engineering Center - National Science Foundation [DMR-1420709]

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The biexciton lifetimes in HgTe colloidal quantum dots are measured as a function of particle size. Samples produced by two synthetic methods, leading to partially aggregated or well-dispersed particles, exhibit markedly different dynamics. The relaxation characteristics of partially aggregated HgTe inhibit reliable determinations of the Auger lifetime. In well-dispersed HgTe quantum dots, the biexciton lifetime increases approximately linearly with particle volume, confirming trends observed in other systems. The extracted Auger coefficient is three orders of magnitude smaller than that for bulk HgCdTe materials with similar energy gaps. We discuss these findings in the context of understanding Auger relaxation in quantum-confined systems and their relevance to mid infrared optoelectronic devices based on HgTe colloidal quantum dots.

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