GaAs:Cr X-ray sensors noise characteristics investigation by means of amplitude spectrum analysis

The investigation results of GaAs:Cr X-ray sensor noise characteristics are presented. Measured samples were 3*3 mm(2) and thickness in the range of 300-500 mu m. It is shown that the proposed method can be used to reveal the nature of dominant noise and calculate the energy resolution of structures. This technique allows estimation of the optimal operating voltage of GaAs: Cr sensors and characterization of detector material.