期刊
JOURNAL OF INSTRUMENTATION
卷 13, 期 -, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/1748-0221/13/04/C04004
关键词
Inspection with x-rays; X-ray detectors; X-ray diffraction detectors
We report on indirect X-ray detector systems for various full-field, ultra high-speed X-ray imaging methodologies, such as X-ray phase-contrast radiography, diffraction topography, grating interferometry and speckle-based imaging performed at the hard X-ray imaging beamline ID19 of the European Synchrotron - ESRF. Our work highlights the versatility of indirect X-ray detectors to multiple goals such as single synchrotron pulse isolation, multiple-frame recording up to millions frames per second, high efficiency, and high spatial resolution. Besides the technical advancements, potential applications are briefly introduced and discussed.
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