期刊
JOURNAL OF ELECTRONIC MATERIALS
卷 47, 期 8, 页码 4356-4360出版社
SPRINGER
DOI: 10.1007/s11664-018-6303-9
关键词
MgZnO; rocksalt structure; deep ultraviolet emission; mist CVD; cathodoluminescence
资金
- JSPS [17H01263]
- Grants-in-Aid for Scientific Research [17H01263] Funding Source: KAKEN
Rocksalt-structured Mg (x) Zn1-x O films with Mg composition x of 0.47, 0.57, and 0.64 were grown on (100)-oriented MgO substrates using mist chemical vapor deposition. Cathodoluminescence measurements showed deep ultraviolet (DUV) emission peaking at 4.88 eV (254 nm), 5.15 eV (241 nm), and 5.21 eV (238 nm), respectively, at 12 K. The peak energies were lower than the band gap energies by ca. 1 eV, suggesting that the deep ultraviolet (DUV) emission may be recognized as near band edge luminescence but is associated with impurities, defects, or band fluctuations. The use of carbon-free precursors in the growth is suggested to eliminate carbon impurities and to improve the optical properties of Mg (x) Zn1-x O.
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