In-plane electrical conduction mechanisms of highly dense carbon nanotube forests on silicon carbide

We have investigated the length-dependence of the in-plane electrical resistivity of vertically aligned and highly dense carbon nanotube (CNT) films that were dense enough to conduct electrons. The in-plane conductivity is well accounted for by a combination of inter-tube hopping (variable range hopping, VRH) and graphitic conduction. VRH conduction was dominant in the thinner CNT films, and the films showed negative temperature dependence of resistivity. The dimension of the VRH component varied depending on the CNT length. In the thicker CNT films, the graphitic conduction appeared, and then, the localization length spread, leading to the positive temperature dependence of resistivity. This behavior can be explained by the presence of a labyrinthine arrangement of graphene walls among aligned CNTs, which was confirmed by transmission electron microscopy observations. Published by AIP Publishing.