期刊
SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2
卷 778-780, 期 -, 页码 855-+出版社
TRANS TECH PUBLICATIONS LTD
DOI: 10.4028/www.scientific.net/MSF.778-780.855
关键词
PiN diode; high voltage; large-area device; forward voltage drop
资金
- Japan Society for the Promotion of Science (JSPS)
- Council for Science and Technology Policy (CSTP)
We successfully fabricated 13-kV, 20-A, 8 mm x 8 mm, drift-free 4H-SiC PiN diodes. The fabricated diodes exhibited breakdown voltages that exceeded 13 kV, a forward voltage drop of 4.9-5.3 V, and an on-resistance (R(on)A(active)) of 12 m Omega.cm(2) at 100 A/cm(2). The blocking yield at 10 kV on a 3-in wafer exceeded 90%. We investigated failed devices using the Candela wafer inspection system and light-emission microscope and found that a few devices failed because of large defects on the chip. We also demonstrated that the fabricated diodes can be used in conducting high-voltage and high-current switching tests.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据