期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 65, 期 2, 页码 547-554出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2017.2779790
关键词
CMOS single-photon avalanche diode (SPAD); quanta image sensor; single-photon counting (SPC); switched current source (SCS) counter
资金
- European Research Council [339747]
A 256 x 256 single-photon avalanche diode image sensor operating at 100 kfps with fill factor of 61% and pixel pitch of 16 mu m is reported. An all-nMOS 7T pixel allows gated operation down to 4 ns and similar to 600-ps fall time with on-chip delay generation. The sensor operates with 0.996 temporal aperture ratio in rolling shutter. Gating and cooling allow the suppression of dark noise, which, in combination with the high fill factor, enables competitive low-light performance with electronmultiplying charge-coupled devices while offering time-resolved imaging modes.
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