期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 65, 期 7, 页码 3073-3076出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2018.2834498
关键词
Amorphous In-Ga-Zn-O; electrostatic potential; sensor; thin-film transistor; top-gate effect
In this paper, we discuss a preliminary possibility for sensing of electrostatic potential by taking advantage of the coupling effect in double-gate amorphous In-Ga-Zn-O thin-film transistors (TFTs) (a-In-Ga-Zn-O TFTs), which we call the top-gate effect. The TFT sensing device responds to attaching and detaching charged dielectric materials to the device surface. Drain current of the TFT sensing device changes, depending on the polarity of the charge with a sensitivity of 50 nA/kV. Results discussed here may lead to the possibility for a 2-D active-matrix electrostatic potential sensor.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据