期刊
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
卷 66, 期 2, 页码 287-291出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCSII.2018.2849028
关键词
Circuit reliability; radiation hardening; soft error; double-node upset; single node upset
资金
- National Natural Science Foundation of China [61874042, 61604001, 61574052, 61602107]
- Anhui University Doctor Startup Fund [J01003217]
- Project Team of Anhui Institute of Economic Management [YJKT1417T01]
- Natural Science Foundation of Hunan Province, China [2018JJ3072]
- 2017 CCF-IFAA Research Fund
This brief presents a double-node upset (DNU) self-recoverable latch design for high performance and low power application. The latch is mainly constructed from eight mutually feeding hack C-elements and any node pair of the latch is DNU self-recoverable. Using a high speed transmission path and a clock gating technique, the latch has high performance and low power dissipation. Simulation results demonstrate the DNU self-recoverability of the latch and also show that the delay-power-area product of the latch is improved approximately by 81.80% on average, compared with the latest DNU self-recoverable latch designs.
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