4.8 Article

Nitroacetylacetone as a Cofuel for the Combustion Synthesis of High-Performance Indium-Gallium-Zinc Oxide Transistors

期刊

CHEMISTRY OF MATERIALS
卷 30, 期 10, 页码 3323-3329

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.chemmater.8b00663

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资金

  1. Northwestern University MRSEC (NSF) [DMR-1720139]
  2. AFOSR [FA9550-15-1-0044]
  3. Flexterra Corp.
  4. MRSEC program (NSF) [DMR-1121262]
  5. International Institute for Nano technology (IIN)
  6. Keck Foundation
  7. State of Illinois
  8. China Scholarship Council
  9. ASEE
  10. Shenzhen Peacock Plan project [KQTD20140630110339343]

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Thin-film combustion synthesis has been utilized for the fabrication of solution processed high-performance metal oxide thin-film transistors (MOTFTs) at lower temperatures than conventional sol-gel processes. The fuel-oxidizer ensemble in the MO precursor solution/film plays an important role in achieving high-efficiency and low-residual combustion byproducts. However, unlike conventional bulk combustion, only a very limited number of thin-film fuels have been investigated. Here we report the use of an efficient new cofuel, 3-nitroacetylacetone (NAcAcH), incorporating a -NO2 group, for the combustion synthesis of display-relevant indium-gallium-zinc-oxide (IGZO) thin films. Compared to the traditional acetylacetone (AcAcH) fuel, a higher enthalpy of combustion (988.6 vs 784.4 J/g) and a lower ignition temperature (107.8 vs 166.5 degrees C) are achieved for NAcAcH-based formulations. The resulting NAcAcH-derived IGZO TFTs exhibit far higher average electron mobilities (5.7 cm(2) V-1 s(-1)) than AcAcH-derived TFTs (2.7 cm(2) V-1 s(-1)). More importantly, when combining AcAcH with NAcAcH as cofuels in an optimal molar ratio of 1.5:0.5, an even larger TFT electron mobility (7.5 cm(2) v(-1) s(-1)) and more stable devices are achieved. Comprehensive IGZO precursor/film analysis and characterization by differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), X-ray photoelectron spectroscopy (XPS), grazing incidence X-ray diffraction (GIXRD), and X-ray reflectivity (XRR) explain the basis of the film microstructure and TFT performance trends.

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