期刊
CARBON
卷 134, 期 -, 页码 71-79出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.carbon.2018.03.072
关键词
Angular-resolved X-ray induced photoelectron spectroscopy; ARXPS; C 1s; C KVV; Parameter D; C sp(2)/C sp(3); Argon gas cluster ion beam; ArGCIB; Maximum entropy method; MEM; Depth profile reconstruction
资金
- Czech Grant Agency [GA15-05864S]
- Grant Agency of the Czech Technical University in Prague [SGS16/190/OHK4/2T/17]
- Ministry of Education, Youth and Sports of the Czech Republic [LM2015088]
Carbon atom coordination at diamond-like carbon (DLC) film surfaces and in sub-surface regions has been determined nondestructively from high-energy resolved C 1s photoelectron spectra, X-ray induced C KVV Auger electron spectra, and angular-resolved C 1s spectra (ARXPS) aided by maximum entropy method (MEM). The spectra were recorded from hydrogen-free DLC films prepared by a pulsed laser deposition under medium energy Ar ion beam assisted growth. The sp(3) and sp(2) fractions determined from C 1s and C KVV spectra recorded at the normal emission angle differ substantially. This indicates an inhomogeneous depth-resolved distribution of the fractions. The result is validated by the analysis of angular-resolved C 1s spectra using the MEM approach. In-depth reconstructions of the carbon bonding states show that sp(2) coordination is dominant at the surfaces. We found that Ar ion beam assisted growth induces a C sp(2) peak beneath the surface. The peak shifts towards the surface and is growing with Ar ion energy. C sp(3) hybridization is dominant in deeper layers. The in-depth reconstruction is further supported by the depth-dependent mass density determined from the low-loss electron spectra excited at various primary electron energy. The results are discussed within the subplantation model. (C) 2018 Elsevier Ltd. All rights reserved.
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