期刊
WIPDA 2015 3RD IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS
卷 -, 期 -, 页码 236-240出版社
IEEE
关键词
comparator; silicon carbide; high temperature electronics; wide bandgap ICs
资金
- Div Of Industrial Innovation & Partnersh
- Directorate For Engineering [1465243] Funding Source: National Science Foundation
This paper demonstrates the first reported high temperature voltage comparator in CMOS silicon carbide. The comparator was designed in a 1.2 mu m CMOS SiC process and has been tested for a voltage supply of 12 V to 15 V. The rail to rail voltage comparator has been tested up to 450 degrees C with rise and fall times of 31 ns and 22 ns respectively, and positive and negative propagation delays of 108 ns and 107 ns respectively.
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