期刊
APPLIED SURFACE SCIENCE
卷 456, 期 -, 页码 980-984出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2018.06.180
关键词
Growth of non-stoichiometric oxides; Oxygen loss; Europium monoxide; EuO; Chemical and structural characterization; Semiconductors; Near-infrared optical response
类别
资金
- Spanish Ministry of Economy and Competitiveness [MINECO/FEDER TEC2015-69916-C2-1-R, MAT2013-47878-C2-1-R, MAT2013-48009-C4-1-P]
- FEDER funds
- EC's Horizon2020 Research and Innovation Programme [645776]
- Austrian Science Fund - FWF [P24471, P26830]
- NATO Science for Peace Programme [984735]
- [BES-2013-062593]
Nanocrystalline textured EuO thin films are prepared by an oxygen loss process from a pure Eu2O3 bulk ceramic target through pulsed laser deposition in vacuum at room temperature. X-ray diffraction spectra evidence a well-defined diffraction peak corresponding to the EuO phase textured along the (1 1 0) direction. Analysis of the XRD peak profile indicates that the films are nanocrystalline (average crystallite size of 11 nm) with a compressive residual strain. The formation of stoichiometric EuO is further confirmed by a strong signal from Eu2+ in the Xray photoelectron spectra. The complex refractive index in the near infrared has been determined by spectroscopic ellipsometry and shows that the EuO films have a high transparency (k < 10(-3)) and a refractive index of 2.1. A band-gap shift of 0.25 eV is found with respect to the EuO bulk. These films, deposited by an accessible and efficient method, open a new route to produce EuO films with optical quality, suitable for NIR optoelectronic components.
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