4.2 Article

Structural and dielectric properties of Na2Pb2Nd2W2Ti4V4O30 ferroelectric ceramics

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INDIAN JOURNAL OF PHYSICS
卷 90, 期 2, 页码 155-162

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INDIAN ASSOC CULTIVATION SCIENCE
DOI: 10.1007/s12648-015-0738-0

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Ceramic; Ferroelectricity; X-ray diffraction; Impedance

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The polycrystalline ceramic of Na2Pb2Nd2W2Ti4V4O30 was prepared by a conventional moderate-temperature (similar to 700 degrees C) mixed-oxide method. Calcination and sintering temperatures were determined from differential thermal analysis/thermogravimetric analysis data. The formation of a single-phase compound was confirmed from room-temperature X-ray diffraction analysis. The morphology of the sintered sample recorded by scanning electron microscope exhibited a uniform grain distribution. The existence of ferroelectricity in the material was confirmed from the nature of variation in dielectric constant, tangent loss, and polarization with temperature and frequency. The variation of AC and DC conductivities with temperature determined the nature of charge carrier in the sample, and frequency dependence of AC conductivity obeyed Jonscher's universal power law at higher-frequency but slightly deviated in low-frequency range.

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