Extended Malus law with terahertz metallic metamaterials for sensitive detection with giant tunable quality factor

We study a polarizer-analyzer mounting for the terahertz regime with perfectly conducting metallic polarizers made of a periodic subwavelength pattern. With a renewed Jones formalism, we analytically investigate the influence of the multiple reflections, which occur between the polarizer and the analyzer, on the transmission response. We demonstrate that this interaction leads to a modified transmission response: the extended Malus law. In addition, we show that the transmission response can be controlled by the distance between the polarizer and the analyzer. For particular setups, the mounting exhibits extremely sensitive transmission responses. This interesting feature can be employed for high-precision sensing and characterization applications. We specifically propose a general design for measuring the electro-optical response of materials in the terahertz domain allowing detection of refractive index variations as small as 10(-5).