期刊
ACTA MATERIALIA
卷 148, 期 -, 页码 49-54出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2018.01.038
关键词
Phase diagram; Miscibility gap; Thin films; Secondary neutral mass spectrometry (SNMS); Diffusion
资金
- European Union [GINOP-2.3.2-15-2016-00041]
- European Regional Development Fund [GINOP-2.3.2-15-2016-00041]
- Hungarian Academy of Sciences Postdoctoral Fellowship Programme
The existence of the miscibility gap in the Cu-Ni system has been an issue in both computational and experimental discussions for half a century. Here we propose a new miscibility gap in the Cu-Ni system measured in nano-layered films by Secondary Neutral Mass Spectrometry. The maximum of the symmetrical miscibility curve is around 780K at Cu50%Ni50%. This is the first experiment determining the miscibility from the measurement of the atomic fraction of Copper and Nickel in the whole composition range. (C) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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