期刊
ACS APPLIED MATERIALS & INTERFACES
卷 10, 期 18, 页码 15778-15785出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsami.7b17439
关键词
giant negative piezoresistive effect; hydrogenated diamond-like carbon; diamond-like carbon-containing Ni; Raman scattering; EDS; X-ray photoelectron spectroscopy
资金
- Research Council of Lithuania [MIP-070/2013]
Piezoresistive properties of hydrogenated diamond-like carbon (DLC) and DLC-based nickel nano-composite (DLC:Ni) films were studied in the range of low concentration of nickel nanoparticles. The films were deposited by reactive high power pulsed magnetron sputtering (HIPIMS) of Ni target, and some samples were deposited by direct current (dc) reactive magnetron sputtering for comparison purposes. Raman scattering spectroscopy, energy-dispersive X-ray spectrometry (EDS), and X-ray photoelectron spectroscopy (XPS) were used to study the structure and chemical composition of the films. A four-point bending test was applied to study piezoresistive properties of the films. For some samples containing less than 4 at. % Ni and for the samples containing no Ni (as defined by both EDS and XPS), a giant negative piezoresistive effect was observed. The giant negative piezoresistive effect in DLC films deposited by either reactive HIPIMS or dc magnetron sputtering of Ni target was explained by possible clustering of the sp(2) -bonded carbon and/or formation of areas with the decreased hydrogen content. It was suggested that the tensile stress-induced rearrangements of these conglomerations have resulted in the increased conductivity paths.
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