3.8 Article

Assessment of fit of item response theory models used in large-scale educational survey assessments

期刊

出版社

SPRINGER
DOI: 10.1186/s40536-016-0025-3

关键词

Generalized residual; Item fit; Residual analysis; Two-parameter logistic model

资金

  1. Institute of Education Sciences, U.S. Department of Education part of the Statistical and Research Methodology in Education Initiative [R305D120006]

向作者/读者索取更多资源

Latent regression models are used for score-reporting purposes in large-scale educational survey assessments such as the National Assessment of Educational Progress (NAEP) and Trends in International Mathematics and Science Study (TIMSS). One component of these models is based on item response theory. While there exists some research on assessment of fit of item response theory models in the context of large-scale assessments, there is a scope of further research on the topic. We suggest two types of residuals to assess the fit of item response theory models in the context of large-scale assessments. The Type I error rates and power of the residuals are computed from simulated data. The residuals are computed using data from four NAEP assessments. Misfit was found for all data sets for both types of residuals, but the practical significance of the misfit was minimal.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

3.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据