期刊
ACS PHOTONICS
卷 5, 期 7, 页码 2568-2573出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsphotonics.7b01527
关键词
visible metasurfaces; aluminum plasmonics; on-chip polarimetry; polarization analysis
类别
资金
- Ministry of Science and Technology, Taiwan [MOST-106-2745-M-002-003-ASP, 104-2221-E-259-028-MY3]
- Academia Sinica [AS-103-TP-A06]
- National Center for Theoretical Sciences
- NEMS Research Center of National Taiwan University
- National Center for High-Performance Computing, Taiwan
- Research Center for Applied Sciences, Academia Sinica, Taiwan
Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.
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