期刊
NANO ENERGY
卷 41, 期 -, 页码 566-572出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nanoen.2017.10.016
关键词
Next generation photovoltaics; Nanowire-based solar cells; Conductive-AFM; III-V semiconductors
类别
资金
- NanoTera through project Synergia [20NA21_150950]
- H2020 ITN project Indeed
- Swiss National Science Foundation [PZENP2_154283]
- Swiss Government Excellence Scholarship
- SNF Ambizione Energy program
- FOM - The Netherlands Organization for Scientific Research (NWO) (LMPV)
- ERC of the StG 'UpCon' [239743]
- European Research Council (ERC) [239743] Funding Source: European Research Council (ERC)
- Swiss National Science Foundation (SNF) [PZENP2_154283] Funding Source: Swiss National Science Foundation (SNF)
The photonic properties of nanowires advocate for their utilization in next generation solar cells. Compared to traditional devices, the electric scheme is transformed from a single into an ensemble of pn junctions connected in parallel. This new configuration requires new schemes for the characterization. We show how conductive-probe atomic force microscopy, C-AFM, is an essential tool for the characterization and optimization of this parallel-connected nanowire devices. With C-AFM it is possible to obtain both surface topography and local electrical characterization with nanoscale resolution. We demonstrate topography and current mapping of nanowire forests, combined with current-voltage measurements of the individual nanowire junctions from the ensemble. Our results provide discussion elements on some factors limiting the performance of a nanowire-based solar cell and thereby to provide a path for their improvement.
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