期刊
APPLIED SURFACE SCIENCE
卷 395, 期 -, 页码 157-161出版社
ELSEVIER
DOI: 10.1016/j.apsusc.2016.05.002
关键词
Field emission; HOPG; Scanning near-field optical microscopy; Scanning electron microscopy
类别
资金
- European Centre of Excellence CEITEC [CZ.1.05/1.1.00/02.0068]
- Technology Agency of Czech Republic project [TE01020118]
This paper deals with the electrical characterization of highly ordered pyrolytic graphite (HOPG) surface based on field emission of electrons. The effect of field emission occurs only at disrupted surface, i.e. surface containing ripped and warped shreds of the uppermost layers of graphite. These deformations provide the necessary field gradients which are required for measuring tunneling current caused by field electron emission. Results of the field emission measurements are correlated with other surface characterization methods such as scanning near-field optical microscopy (SNOM) or atomic force microscopy. (C) 2016 Elsevier B.V. All rights reserved.
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