期刊
ACS APPLIED MATERIALS & INTERFACES
卷 9, 期 20, 页码 16996-17002出版社
AMER CHEMICAL SOC
DOI: 10.1021/acsami.7b01260
关键词
electrochromism; ellipsometry; ion trapping; smart windows; rejuvenation; time-of-flight secondary ion mass spectrometry; ToF-SIMS; WO3
资金
- Mexican Council for Science and Technology (CONACyT) [266848]
- European Research Council under the European Community's Seventh Framework Program
- ERC grant [267234]
- Natural Sciences and Engineering Research Council (NSERC) of Canada [433808-11]
- Fonds de Recherche Quebecois sur la Nature et les Technologies (FRQNT)
- European Research Council (ERC) [267234] Funding Source: European Research Council (ERC)
Electrochromic (EC) smart windows are able to decrease our energy footprint while enhancing indoor comfort and convenience. However, the limited durability of these windows, as well as their cost, result in hampered market introduction. Here, we investigate thin films of the most widely studied EC material, WO3. Specifically, we combine optical measurements (using spectrophotometry in conjunction with variable-angle spectroscopic ellipsometry) with time-of-flight secondary ion mass spectrometry and atomic force microscopy. Data were taken on films in their as-deposited state, after immersion in a Li-ion-conducting electrolyte, after severe degradation by harsh voltammetric cycling and after galvanostatic rejuvenation to regain the original EC performance. Unambiguous evidence was found for the trapping and detrapping of Li ions in the films, along with a thickness increase or decrease during degradation and rejuvenation, respectively. It was discovered that (i) the trapped ions exhibited a depth gradient; (ii) following the rejuvenation procedure, a small fraction of the Li ions remained trapped in the film and gave rise to a weak short-wavelength residual absorption; and (iii) the surface roughness of the film was larger in the degraded state than in its virgin and rejuvenated states. These data provide important insights into the degradation mechanisms of EC devices and into means of achieving improved durability.
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