Temperature dependence of Rashba-Edelstein magnetoresistance in Bi/Ag/CoFeB trilayer structures

We have investigated the recently discovered Rashba-Edelstein magnetoresistance (REMR) in Bi/Ag/CoFeB trilayer structures with different temperatures, Bi thicknesses, and magnetic fields via the angular-dependent magnetoresistance (ADMR) measurements. We found that the magnitude of the REMR shows a small variation with changing temperature, which is consistent with the previous work on the temperature evolution of the inverse Rashba-Edelstein effect. Furthermore, the ADMR measurements with different thicknesses of Bi layers and external magnetic fields revealed that the contribution from the field-dependent magnetoresistance is not negligibly small for thicker Bi films (>= 10 nm) at low temperature. Published by AIP Publishing.