期刊
NANO FUTURES
卷 1, 期 2, 页码 -出版社
IOP PUBLISHING LTD
DOI: 10.1088/2399-1984/aa8434
关键词
avalanche effect; superlattice; phase change memory; strain engineering; interfacial disordering
资金
- SUTD-MIT International Design Centre (IDC), Designer Chalcogenides Project [IDCSF1200108OH]
- A-star Singapore-China joint research program [1420200046]
- National Key Research and Development Program of China [2017YFB0701703]
- National Natural Science Foundation of China [61076121]
By confining phase transitions to the nanoscale interface between two different crystals, interfacial phase change memory heterostructures represent the state of the art for energy efficient data storage. We present the effect of strain engineering on the electrical switching performance of the Sb2Te3-GeTe superlattice van der Waals devices. Multiple Ge atoms switching through a two-dimensional Te layer reduces the activation barrier for further atoms to switch; an effect that can be enhanced by biaxial strain. The out-of-plane phonon mode of the GeTe crystal remains active in the superlattice heterostructures. The large in-plane biaxial strain imposed by the Sb2Te3 layers on the GeTe layers substantially improves the switching speed, reset energy, and cyclability of the superlattice memory devices. Moreover, carefully controlling residual stress in the layers of Sb2Te3-GeTe interfacial phase change memories provides a new degree of freedom to design the properties of functional superlattice structures for memory and photonics applications.
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