期刊
APPLIED SURFACE SCIENCE
卷 424, 期 -, 页码 368-373出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.apsusc.2017.02.106
关键词
Indium tin oxide; rf-MS technique; X-ray diffraction; Thin films; Structural and optical properties
类别
资金
- Romanian Ministry of Education, Research, Youth and Sport [PN-II-RU-ID52/2012]
- Romanian Space Agency [STAR 65/2013]
Using a fast and eco-friendly deposition method, ITO thin films with different thicknesses (0.5 mu m-0.7 mu m) were deposited on glass substrates by radio frequency magnetron sputtering technique. A comparative analysis of these oxide films was then carried out. AFM investigations showed that the deposited films were smooth, uniform and having a surface roughness smaller than 10 nm. X-ray diffraction investigations showed that all samples were polycrystalline and the grain sizes of the films, corresponding to (222) cubic reflection, were found to increase with the increasing film thickness. The optical properties, evaluated by UV-VIS-NIR (190-3000 nm) spectrophotometer, evidenced that the obtained thin films were highly transparent, with a transmission coefficient between 90 and 96%, depending on the film thickness. Various methods (Swanepoel and Drude) were employed to appreciate the optimal behaviour of transparent oxide films, in determining the dielectric optical parameters and refractive index dispersion for ITO films exhibiting interference patterns in the optical transmission spectra. The electrical conductivity also increased as the film thickness increased. (C) 2017 Elsevier B.V. All rights reserved.
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