期刊
ULTRAMICROSCOPY
卷 173, 期 -, 页码 64-70出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2016.11.019
关键词
Electron holography; Lithium ion conductor; Electric-field leakage; 3D-boundary-charge method; Focused ion beam damage layers; Chemical stability in air
类别
资金
- RISING project of the New Energy and Industrial Technology Development Organization (NEDO) of Japan
Advanced techniques for overcoming problems encountered during in situ electron holography experiments in which a voltage is applied to an ionic conductor are reported. The three major problems encountered were 1) electric-field leakage from the specimen and its effect on phase images, 2) high electron conductivity of damage layers formed by the focused ion beam method, and 3) chemical reaction of the specimen with air. The first problem was overcome by comparing experimental phase distributions with simulated images in which three-dimensional leakage fields were taken into account, the second by removing the damage layers using a low-energy narrow Ar ion beam, and the third by developing an air-light biasing specimen holder.
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