4.4 Article

Influence of deposition distance and substrate temperature on the CdSe thin films deposited by electron beam evaporation technique

期刊

THIN SOLID FILMS
卷 625, 期 -, 页码 138-147

出版社

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2017.01.053

关键词

Chalcogenides; Semiconductors; Thin films; X-ray diffraction; Surface morphology; Optical properties

资金

  1. SRM University, SRM Nagar, Kattankulathur

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Cadmium Selenide (CdSe) thin films were deposited on the microslide glass substrates by electron beam evaporation technique at source to substrate distance (D-d) of 10 cm and 15 cm and at different substrate temperatures (room temperature to 450 C). The influence of D-d and substrate temperature on the structural, optical and morphological properties of CdSe thin films was studied. X-ray diffraction studies revealed that CdSe films deposited at 10 cm and 15 cm and at different substrate temperatures possess hexagonal crystal system with preferential growth along (002) plane. Further the effect of D-d and substrate temperature on the microstructural parameters such as crystallite size, strain, dislocation density and lattice constants was studied. CdSe films deposited at D-d 10 cm and 15 cm and at 150 C acquired low strain and dislocation density with respect to that of the other films. The optical transmittance of the film deposited at D-d 10 cm and at 350 degrees C showed maximum transmittance of about 98% at 875 nm whereas the film deposited at D-d 15 cm and at room temperature showed maximum transmittance of about 84% at 747 nm. Direct optical band gap energy of the films deposited at D-d 10 CM is decreased with increase in substrate temperature. Scanning electron microscope studies revealed that the surface of the CdSe film deposited at D-d 10 cm and at room temperature contains spherical shaped grains distributed on the surface and the surface becomes smooth with increase in substrate temperature. Surface of the film deposited at D-d 15 cm and at room temperature showed fine grains with a few pinholes whereas the surface of the film deposited at 250 C and 350 C become rough with pinholes. Elemental analysis showed the presence of cadmium and selenium in the deposited thin films. Photoluminescence spectrum showed red emission band at similar to 740 nm for the films deposited at D-d 10 cm and 15 cm and at room temperature, 150 degrees C and 450 degrees C. (C) 2017 Elsevier B.V. All rights reserved.

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