4.2 Article

Advanced analysis of copper X-ray photoelectron spectra

期刊

SURFACE AND INTERFACE ANALYSIS
卷 49, 期 13, 页码 1325-1334

出版社

WILEY
DOI: 10.1002/sia.6239

关键词

copper; XPS; X-ray photoelectron spectroscopy; peak-fitting; oxides; Auger; Wagner plot

资金

  1. Natural Science and Engineering Research Council (NSERC, Ottawa)
  2. Nuclear Waste Management Organization (NWMO, Toronto)

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Chemical state X-ray photoelectron spectroscopic analysis of copper species is challenging because of the complexity of the 2p spectra resulting from shake-up structures for Cu(II) species and overlapping binding energies for Cu metal and Cu(I) species. This paper builds upon and extends previously published X-ray photoelectron spectroscopy curve-fitting and data analysis procedures for a wide range of copper containing species. Steps undertaken include the following: (i) an examination of existing Cu 2p(3/2) main peak and Cu 2p(3/2) - Cu L3M4,5M4,5 Auger parameter literature data, (ii) analysis of a series of quality standard samples, (iii) curve-fitting procedures for both the Cu 2p(3/2) and the Cu L3M4,5M4,5 spectra (as well as associated anions), (iv) calculations that determine the amount of Cu(II) species in a mixed oxidation state system, (v) calculations and necessary data for thin film mixed oxide/hydroxide thickness measurements, and (vi) a presentation of literature and standard sample values in a Wagner (chemical state) plot. Copyright (c) 2017 John Wiley & Sons, Ltd.

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