期刊
SCRIPTA MATERIALIA
卷 130, 期 -, 页码 178-181出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2016.11.038
关键词
Shear strength; Interfaces; Multilayers; In situ; Transmission electron microscopy
类别
资金
- US DOE-BES [DEFG02-05ER46217]
- ONR-MURI [N00014-11-1-0678]
This work employs in-situ transmission electron microscopy based nanopillar compression of physical vapor deposited multilayers to measure the-interfacial shear strengths of model Ag-Pd, Ag-Au, Ag-Ni, Ag-Cu, and Cu-Ni (111) oriented cube-on-cube interfaces. The experimental trends are primarily rationalized by considering the coherency regimes. Coherent interfaces shear via slip transmission across them. Pillars containing semi coherent interfaces with <5% atomic misfit deform rather homogeneously. Interfaces exhibiting atomic misfit >5% shear locally and their interfacial shear strength decreases with increasing misfit. (C) 2016 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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