期刊
QUANTUM BEAM SCIENCE
卷 2, 期 2, 页码 -出版社
MDPI
DOI: 10.3390/qubs2020013
关键词
Laue diffraction; microdiffraction; synchrotron; strain; stress measurements; microstructure imaging; nickel-based superalloys
类别
资金
- US DOE Office of Science User Facility [DE-AC02-05CH11231]
- National Natural Science Foundation of China [51671154]
- National Key Research and Development Program of China [2016YFB0700404]
- National Basic Research Program of China (973 Program) [2015CB057400]
- Collaborative Innovation Center of High-End Manufacturing Equipment
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies
Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for material structure and deformation at the micrometer and nanometer scales. We will review the achievements of this technique at the Advanced Light Source (Berkeley, CA, USA), and demonstrate its application in the thorough microstructural investigations of laser-assisted 3D printed nickel-based superalloys.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据