期刊
POWDER DIFFRACTION
卷 32, 期 -, 页码 S16-S21出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S0885715617000768
关键词
XANES imaging; microfocus; diffraction mapping; synchrotron
资金
- AINSE Ltd [11749]
- Australian Research Council (ARC) Centre of Excellence for Advanced Molecular Imaging
- Leverhulme Trust Research Project Grant [RPG-2016-190]
Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil. (C) 2017 International Centre for Diffraction Data.
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