4.5 Article

High-voltage transition studies from rectification to resistive switching in Ag/PVDF/Au capacitor-like structures

期刊

POLYMER BULLETIN
卷 75, 期 7, 页码 2769-2778

出版社

SPRINGER
DOI: 10.1007/s00289-017-2178-9

关键词

PVDF thin film; RRAM; Non-volatile memory; Rectification; Resistive switching

资金

  1. DAE-BRNS [2012/20/37P/09/BRNS]
  2. DST [SERB/F/0724/2013-2014]
  3. UGC-MRP [41-846/2012]
  4. UGCSAP [F.530/15/DRS/2009]
  5. Central Instrumentation Facility (CIF) at Pondicherry University
  6. UGC

向作者/读者索取更多资源

This work reports the transition from rectifying type to resistive switching in semicrystalline, unpoled intrinsic form of polyvinylidene fluoride (PVDF) thin films in Ag/PVDF/Au capacitor-like structures. The transition is noted after the breakdown of Schottky barrier at electric fields of 3 MV/cm along with the changeover from asymmetric to symmetric I-V curves. The sharp change from asymmetric to symmetric I-V loops further revealed bipolar-resistive switching. The asymmetric and symmetric I-V transport mechanisms are evaluated with the Fowler-Nordheim tunneling and space-charge-limited current mechanisms at high voltages. Furthermore, the resistive-switching phenomena are attributed to the filament formation from the ohmic response of the low-resistance state.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.5
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据