New multipactor dynamics in presence of dielectrics

A new multipactor saturation mechanism is presented for high power microwave devices in the presence of dielectrics. Recent measures have shown that the positive charge deposited on a dielectric as a consequence of the secondary electron emission causes the reduction of its secondary electron yield. This work shows a new multipactor dynamics within a partially filled parallel-plate waveguide where both the decrease of the secondary electron yield with the charge on the dielectric and the subsequent electrostatic field produced are taken into account. The results obtained show that these two mechanisms predict the multipactor saturation as well as some differences with the classical resonance theory when charged dielectrics come into play. Published by AIP Publishing.