Late-time growth rate, mixing, and anisotropy in the multimode narrowband Richtmyer-Meshkov instability: The θ-group collaboration

Turbulent Richtmyer-Meshkov instability (RMI) is investigated through a series of high resolution three-dimensional simulations of two initial conditions with eight independent codes. The simulations are initialised with a narrowband perturbation such that instability growth is due to non-linear coupling/backscatter from the energetic modes, thus generating the lowest expected growth rate from a pure RMI. By independently assessing the results from each algorithm and computing ensemble averages of multiple algorithms, the results allow a quantification of key flow properties as well as the uncertainty due to differing numerical approaches. A new analytical model predicting the initial layer growth for a multimode narrowband perturbation is presented, along with two models for the linear and non-linear regimes combined. Overall, the growth rate exponent is determined as theta = 0.292 +/- 0.009, in good agreement with prior studies; however, the exponent is decaying slowly in time. Also, theta is shown to be relatively insensitive to the choice of mixing layer width measurements. The asymptotic integral molecular mixing measures Theta = 0.792 +/- 0.014, Xi = 0.800 +/- 0.014, and psi = 0.782 +/- 0.013 are lower than some experimental measurements but within the range of prior numerical studies. The flow field is shown to be persistently anisotropic for all algorithms, at the latest time having between 49% and 66% higher kinetic energy in the shock parallel direction compared to perpendicular and does not show any return to isotropy. The plane averaged volume fraction profiles at different time instants collapse reasonably well when scaled by the integral width, implying that the layer can be described by a single length scale and thus a single theta. Quantitative data given for both ensemble averages and individual algorithms provide useful benchmark results for future research. Published by AIP Publishing.