4.6 Article

Atomic-scale quantification of charge densities in two-dimensional materials

期刊

PHYSICAL REVIEW B
卷 98, 期 12, 页码 -

出版社

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.98.121408

关键词

-

资金

  1. Initiative and Network Fund of the Helmholtz Association [VH-NG-1317]

向作者/读者索取更多资源

The charge density is among the most fundamental solid state properties determining bonding, electrical characteristics, and adsorption or catalysis at surfaces. While atomic-scale charge densities have as yet been retrieved by solid state theory, we demonstrate both charge density and electric field mapping across a mono-/bilayer boundary in 2D MoS2 by momentum-resolved scanning transmission electron microscopy. Based on consistency of the four-dimensional experimental data, statistical parameter estimation and dynamical electron scattering simulations using strain-relaxed supercells, we are able to identify an AA-type bilayer stacking and charge depletion at the Mo-terminated layer edge.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据