期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2017.01.071
关键词
Wavelength dispersive spectrometer; Proton induced X-ray emission
类别
资金
- Marie Curie Actions - Initial Training Networks (ITN) as an Integrating Activity Supporting Postgraduate Research with Internships in Industry and Training Excellence (SPRITE) [317169]
- Slovenian Research Program [P1-0112]
A new parallel beam wavelength dispersive X-ray emission spectrometer for high energy resolution PIXE analysis using focused proton microbeam has been constructed and installed at the microprobe of the J. Stefan Institute. Polycapillary X-ray optics is used to enhance the solid angle of X-ray collection and to transform collected proton-induced X-rays into quasi parallel beam which is analyzed using diffraction on a flat crystal. The spectrometer is installed in a vacuum chamber and operates in the 2-10 keV energy range. The main characteristics and operational properties are presented together with the results of first characterization measurements. Finally, two selected experimental examples are given illustrating the capabilities of the spectrometer in PIXE analysis and fundamental research in atomic physics. (C) 2017 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据