Influence of near-surface blisters on deuterium transport in tungsten

The effect of near-surface blisters on deuterium transport in tungsten is studied by means of nuclear reaction analysis (NRA) and scanning electron microscopy (SEM). Gentle deuterium plasma loading of different durations and subsequent NRA depth profiling is performed in heavily pre-blistered and unblistered areas on self-damaged tungsten samples. Comparison of the deuterium depth profiles reveals a considerable reduction of the deuterium transport into the bulk due to the presence of near-surface blisters. SEM and NRA results identify the enhanced re-emission of deuterium from the sample due to open blisters as the underlying mechanism, which reduces the deuterium flux into the bulk. Based on a simple analytical hydrogen retention model, the re-emitted deuterium flux by open blisters is determined to be 80% of the implanted deuterium flux in the present conducted experiment. In addition, the deuterium flux into the bulk is reduced by 60% compared to the unblistered case. Hence the presence of blisters is not a general disadvantage in the context of retention, but can be beneficial in slowing down the build up of a certain hydrogen inventory and in reducing the permeation flux.