Fundamental limitations of the polarization purity of x rays

For a few years, x-ray polarimeters have been discussed and even used as a key method for the investigation of fundamental physical questions, from quantum electrodynamics to solid state physics. However, the sensitivity of optical instruments is limited. In the case of x-ray polarimeters, this limitation is connected with the polarization purity. This article quantifies two fundamental effects which lead to a limited polarization purity and, thus, to a limited sensitivity: the divergence of the source and multiple-wave diffraction inside the polarizer crystals. A comparison shows that the current best polarization purities realized in the x-ray range are limited by these effects. The quantitative knowledge of their influence, however, can improve the purity by two orders of magnitude in future polarimetric experiments. (c) 2018 Author(s).