期刊
APL PHOTONICS
卷 3, 期 12, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.5061807
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资金
- BMBF [05K16SJ2]
For a few years, x-ray polarimeters have been discussed and even used as a key method for the investigation of fundamental physical questions, from quantum electrodynamics to solid state physics. However, the sensitivity of optical instruments is limited. In the case of x-ray polarimeters, this limitation is connected with the polarization purity. This article quantifies two fundamental effects which lead to a limited polarization purity and, thus, to a limited sensitivity: the divergence of the source and multiple-wave diffraction inside the polarizer crystals. A comparison shows that the current best polarization purities realized in the x-ray range are limited by these effects. The quantitative knowledge of their influence, however, can improve the purity by two orders of magnitude in future polarimetric experiments. (c) 2018 Author(s).
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