期刊
ELECTRONICS LETTERS
卷 51, 期 4, 页码 330-331出版社
INST ENGINEERING TECHNOLOGY-IET
DOI: 10.1049/el.2014.4374
关键词
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资金
- European Union (European Social Fund)
- Greek national resources
As technology scales down, soft errors, because of single event upsets (SEUs) that affect multiple nodes (through multiple node charge sharing), become a serious concern in nanometre technology integrated circuits. Existing radiation hardening techniques provide partial or no immunity when more than one node are affected. A new latch topology is presented that guarantees soft error tolerance when a single node or any arbitrary combination of node pairs is affected by an SEU. The proposed scheme exploits a positive feedback loop which consists of C-elements. Simulation results validate the efficiency of the new design over existing soft error hardening techniques such as BISER, FERST and TPDICE.
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