期刊
MICROSCOPY RESEARCH AND TECHNIQUE
卷 80, 期 12, 页码 1328-1336出版社
WILEY
DOI: 10.1002/jemt.22945
关键词
atomic force microscopy; fractal analysis; scanning rate; surface micro-morphology
资金
- Ministry of Education, Youth and Sports of the Czech Republic under the project CEITEC 2020 [LQ1601]
- Grant Agency of the Czech Republic [GACR 15-05259S]
- National Sustainability Program [LO1401]
The purpose of this work is to study the dependence of AFM-data reliability on scanning rate. The three-dimensional (3D) surface topography of the samples with different micro-motifs is investigated. The analysis of surface metrics for estimation of artifacts from inappropriate scanning rate is presented. Fractal analysis was done by cube counting method and evaluation of statistical metrics was carrying out on the basis of AFM-data. Combination of quantitate parameters is also presented in graphs for every measurement. The results indicate that the sensitivity to scanning rate growths with fractal dimension of the sample. This approach allows describing the distortion of the images against scanning rate and could be applied for dependences on the other measurement parameters. The article explains the relevance and comparison of fractal and statistical surface parameters for characterization of data distortion caused by inappropriate choice of scanning rate.
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