期刊
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
卷 68, 期 -, 页码 21-29出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2017.05.032
关键词
Nano scratching; Single crystal SiC; Wire sawing; Indentation size effect
类别
资金
- Shandong Provincial Natural Science Foundation of China [ZR2014EEM034]
- National Natural Science Foundation of China [51075240, 51205234]
The wire sawing process for single crystal SiC can be regarded as nano and micro scratching on the work-piece with diamond abrasives. The surface/subsurface quality of wafers is affected by the forces in scratching. In this paper, a theoretical force model for nano and micro scratching in wire sawing of single crystal SiC at arbitrary scratching angle is proposed. The geometrical shape of diamond abrasives is discussed and simplified. Then, a primary force model for the simplified abrasive is established considering the interfacial friction coefficient between the abrasive and work-piece. Indention size effect based on strain gradient plasticity theory and elastic recovery are included in this model. Finally, the influences of input variables on the theoretical force under the actual machined depth in wire sawing are discussed. The validity of this model is verified through nano and micro scratching tests in literatures, and the theoretical model matches well with the experimental results.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据