Single Analyzer Precursor Ion Scans in a Linear Quadrupole Ion Trap Using Orthogonal Double Resonance Excitation

Reported herein is a simple method of performing single analyzer precursor ion scans in a linear quadrupole ion trap using orthogonal double resonance excitation. A first supplementary AC signal applied to the y electrodes is scanned through ion secular frequencies in order to mass-selectively excite precursor ions while, simultaneously, a second fixed-frequency AC signal is applied orthogonally on the x electrodes in order to eject product ions of selected mass-to-charge ratios towards the detector. The two AC signals are applied orthogonally so as to preclude the possibility of (1) inadvertently ejecting precursor ions into the detector, which results in artifact peaks, and (2) prevent beat frequencies on the x electrodes from ejecting ions off-resonance. Precursor ion scans are implemented while using the inverse Mathieu q scan for easier mass calibration. The orthogonal double resonance experiment results in single ion trap precursor scans with far less intense artifact peaks than when both AC signals are applied to the same electrodes, paving the way for implementation of neutral loss scanning in single ion trap mass spectrometers.