期刊
JOURNAL OF MODERN OPTICS
卷 64, 期 10-11, 页码 1096-1103出版社
TAYLOR & FRANCIS LTD
DOI: 10.1080/09500340.2017.1288838
关键词
Strong-field ionization; electron backscattering; nanostructures; near-fields; dielectric nanospheres
类别
资金
- DFG [SPP1840]
- Munich Centre for Advanced Photonics (MAP)
- European Union through the ERC grant ATTOCO [307203]
- ERC grant NearFieldAtto
- [SFB 652/3]
- [mvp00011]
We study strong-field ionization of dielectric nanospheres and focus on the enhancement of the cutoff energies for backscattering electrons resulting from charge interaction. Though recent studies clearly demonstrated the decisive impact of a surface trapping field on the electron backscattering process, a clear picture of the underlying mechanism is lacking. Here, we provide this picture and present a simple and transparent extension of the famous three-step model of strong-field science by adding a triangular surface trapping potential. We justify this model for the case of dielectric nanospheres based on high-level transport simulations. The analysis of the trapping field assisted backscattering provides a universal scaling of the maximal recollision and backscattering energies as 9 U-p and 14.5 U-p, respectively, where U-p is the local ponderomotive potential. The universal nature of the enhancement over the conventional three-step model is of particular interest for the generation of attosecond electron bunches via near-field induced photoemission and high harmonic generation at nanostructures.
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